• DocumentCode
    764060
  • Title

    A combinatorial approach to modeling imperfect coverage

  • Author

    Doyle, Stacy A. ; Dugan, Joanne Bechta ; Patterson-Hine, F. Ann

  • Author_Institution
    Dept. of Comput. Sci., Duke Univ., Durham, NC, USA
  • Volume
    44
  • Issue
    1
  • fYear
    1995
  • fDate
    3/1/1995 12:00:00 AM
  • Firstpage
    87
  • Lastpage
    94
  • Abstract
    A new algorithm combines a coverage model with a combinatorial model to compute system unreliability. Its advantage is that for a class of computer systems, it is simpler than current algorithms. The method applies to combinatorial models which can generate cutsets for the system. This set of cutsets is augmented with cutsets representing the uncovered failures of the system. The resulting set is manipulated by combining standard multi-state and sum-of-disjoint products solution techniques. It is possible to compute the exact unreliability of the system using this algorithm. If the size of the system and the time required for the analysis become prohibitive, however, the solution can be truncated and bounds on the system unreliability computed. The authors´ algorithm is important because it adapts standard combinatorial solution techniques to a problem that was previously thought to require a Markov solution. The ability to model a fault-tolerant computer system completely within a combinatorial model allows results to be calculated more quickly and accurately, and thus to impact system design. This new technology is easily integrated into existing design/analysis methodologies. Coverage provides a more accurate picture of system behavior, and gives more faith in reliability estimates
  • Keywords
    combinatorial mathematics; fault tolerant computing; reliability; algorithm; combinatorial approach; fault-tolerant computer system; imperfect coverage; modeling; multi-state solution technique; sum-of-disjoint products solution technique; system unreliability; Algorithm design and analysis; Computer errors; Design methodology; Error analysis; Fault detection; Fault tolerant systems; Fault trees; NASA; Redundancy; System analysis and design;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/24.376525
  • Filename
    376525