DocumentCode :
764258
Title :
Stability analysis of self-injection-locked oscillators
Author :
Chang, Heng-Chia
Author_Institution :
Blue Commun. Inc., Fremont, CA, USA
Volume :
51
Issue :
9
fYear :
2003
Firstpage :
1989
Lastpage :
1993
Abstract :
This paper addresses the stability analysis of the self-injection-locked oscillators. The analysis is developed for arbitrary self-injection feedback loops and illustrated with the specific case of a simple time-delay cable. It is shown that the output phase stability in self-injection-locked oscillators depends on the feedback loop delay and the types of oscillator circuits, which are represented by equivalent parallel- or series-resonant oscillator models. The self-injection-locked technique can also be used to test the oscillator circuit model when the self-coupling phase is known. The theory is verified by using a self-injection-locked GaAs MESFET oscillator operating at X-band with delay loops.
Keywords :
MESFET integrated circuits; MMIC oscillators; circuit feedback; circuit stability; equivalent circuits; gallium arsenide; injection locked oscillators; GaAs; MESFET oscillator; X-band; delay loops; equivalent parallel-models; feedback loops; oscillator circuits; output phase stability; self-injection-locked oscillators; series-resonant oscillator models; stability analysis; time-delay cable; Automatic testing; Circuit stability; Circuit testing; Delay; Feedback circuits; Feedback loop; Gallium arsenide; MESFETs; Oscillators; Stability analysis;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/TMTT.2003.815863
Filename :
1220786
Link To Document :
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