• DocumentCode
    764333
  • Title

    High-performance microwave coplanar bandpass and bandstop filters on Si substrates

  • Author

    Chan, K.T. ; Chin, Albert ; Li, Ming-Fu ; Kwong, Dim-Lee ; McAlister, Sean P. ; Duh, D.S. ; Lin, W.J. ; Chang, C.Y.

  • Author_Institution
    Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
  • Volume
    51
  • Issue
    9
  • fYear
    2003
  • Firstpage
    2036
  • Lastpage
    2040
  • Abstract
    High-performance bandpass and bandstop microwave coplanar filters, which operate from 22 to 91 GHz, have been fabricated on Si substrates. This was achieved using an optimized proton implantation process that converts the standard low-resistivity (∼10 Ω·cm) Si to a semi-insulating state. The bandpass filters consist of coupled lines to form a series resonator, while the bandstop filter was designed in a double-folded short-end stub structure. For the bandpass filters at 40 and 91 GHz, low insertion loss was measured, close to electromagnetic simulation values. We also fabricated excellent bandstop filters with very low transmission loss of ∼1 dB and deep band rejection at both 22 and 50 GHz. The good filter performance was confirmed by the higher substrate impedance to ground, which was extracted from the well-matched S-parameter equivalent-circuit data.
  • Keywords
    S-parameters; band-pass filters; band-stop filters; coplanar waveguide components; equivalent circuits; microwave filters; millimetre wave filters; waveguide filters; 22 to 91 GHz; bandstop filters; coupled lines; deep band rejection; double-folded short-end stub structure; electromagnetic simulation values; microwave coplanar bandpass filters; optimized proton implantation process; series resonator; transmission loss; well-matched S-parameter equivalent-circuit data; Band pass filters; Couplings; Electromagnetic measurements; Impedance; Insertion loss; Loss measurement; Microwave filters; Propagation losses; Protons; Resonator filters;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.2003.815890
  • Filename
    1220793