Title :
Technique for time-resolved thermal characterisation of optoelectronic devices
Author :
Lanco, L. ; Deveaux, L. ; Ducci, S. ; Likforman, J.P. ; Michel, N. ; Krakowski, M. ; Leo, G. ; Berger, V.
Author_Institution :
Lab. MPQ, Univ. Paris
Abstract :
Demonstrated is a non-destructive technique that allows the characterisation of heating and dissipation processes in waveguide-based optoelectronic devices. The method relies on transmission or reflection measurements with a probe beam injected into one of the waveguide facets. Analysis of temperature-induced Fabry-Perot oscillations allows a time-resolved thermal characterisation of the device
Keywords :
nondestructive testing; optical waveguide components; optoelectronic devices; thermal analysis; dissipation process; heating process; nondestructive technique; probe beam; reflection measurements; temperature-induced Fabry-Perot oscillations; time-resolved thermal characterisation; transmission measurements; waveguide facets; waveguide-based optoelectronic devices;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:20070128
