• DocumentCode
    764441
  • Title

    Coplanar waveguides and microwave inductors on silicon substrates

  • Author

    Reyes, Adolfo C. ; El-Ghazaly, Samir M. ; Dorn, Steve J. ; Dydyk, Michael ; Schroder, Dieter K. ; Patterson, Howard

  • Author_Institution
    Motorola Inc., Tempe, AZ, USA
  • Volume
    43
  • Issue
    9
  • fYear
    1995
  • fDate
    9/1/1995 12:00:00 AM
  • Firstpage
    2016
  • Lastpage
    2022
  • Abstract
    Silicon has many advantages as a microwave substrate material including low cost and a mature technology. The aim of this paper is to evaluate the potential of using high-resistivity silicon as a low-cost low-loss microwave substrate through an experimental comparative study. Coplanar waveguides fabricated on Si, GaAs, and quartz substrates are tested and their characteristics are compared. Microwave spiral inductors and meander lines are also fabricated on various substrates, and their performance is also analyzed. The results demonstrate that the losses of a coplanar transmission line (CPW) realized on high-resistivity (3 k to 7 k Ω-cm) silicon substrates are comparable to the losses of a CPW realized on a GaAs substrate covered with insulators. Furthermore, measured unloaded Q´s of microwave inductive structures on high-resistivity silicon substrates are comparable to the measured unloaded Q´s of the same structures on GaAs and on quartz. This paper demonstrates that high-resistivity Si can be used as a microwave substrate
  • Keywords
    Q-factor measurement; coplanar waveguides; elemental semiconductors; inductors; losses; silicon; Si; coplanar waveguides; high-resistivity materials; meander lines; microwave inductors; microwave substrate material; spiral inductors; unloaded Q´s; Coplanar waveguides; Costs; Gallium arsenide; Inductors; Microwave measurements; Microwave technology; Propagation losses; Silicon; Testing; Transmission line measurements;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.414534
  • Filename
    414534