Title :
Vertical Variation of Kerr Effect in RE-TM Amorphous Film
Author :
Satoh, T. ; Hayashi, S. ; Akihiro, M. ; Satoh, T.
Author_Institution :
Sumitomo Metal Mining Co., Ltd., Central Research Lab.
fDate :
6/1/1985 12:00:00 AM
Keywords :
Amorphous materials; Coercive force; Force measurement; Kerr effect; Magnetic films; Magnetic hysteresis; Optical films; Sputtering; Substrates; Thickness measurement;
Journal_Title :
Magnetics in Japan, IEEE Translation Journal on
DOI :
10.1109/TJMJ.1985.4548594
