Title :
Enhancement of Kerr Effect in Amorphous Gd-Co Alloy System
Author :
Tsutsumi, K. ; Hashima, K. ; Sugahara, H.
Author_Institution :
Mitsubishi Electric Corp., Materials and Electronic Devices Lab.
fDate :
6/1/1985 12:00:00 AM
Keywords :
Amorphous materials; Dielectric films; Dielectric measurements; Dielectric substrates; Kerr effect; Optical films; Optical refraction; Semiconductor films; Silicon; Wavelength measurement;
Journal_Title :
Magnetics in Japan, IEEE Translation Journal on
DOI :
10.1109/TJMJ.1985.4548597