• DocumentCode
    76450
  • Title

    Formation of Nanorods of Undoped and Doped ZnO

  • Author

    Mangamma, G. ; Bakyalakshmi, V. ; Kamruddin, M. ; Dash, Shishir ; Tyagi, A.K.

  • Author_Institution
    Surface & Nanosci. Div., Indira Gandhi Centre Atomic Res., Kalpakkam, India
  • Volume
    12
  • Issue
    6
  • fYear
    2013
  • fDate
    Nov. 2013
  • Firstpage
    919
  • Lastpage
    924
  • Abstract
    Nanocrystalline zinc oxide has unique properties and immense application potential toward nanodevice fabrication. Moreover, piezoelectric properties of nanostructural materials can be tuned to meet specific application needs. Nanocrystalline ZnO as well as Cu-doped ZnO was synthesized in our laboratory. Synthesis of samples with dopant concentrations ranging from 1 to 10 atomic% was carried out. Post-synthesis calcinations of these ceramic oxides at 100 °C and 300 °C resulted in formation of nanocrystalline powders with narrow size distribution. Crystallite size increased from 10 to 70 nm when calcination temperature rose from 100 °C to 700 °C for undoped ZnO. Nanorods of ZnO could be clearly seen in SEM and AFM images. Dimensions were found to be 10 nm diameter and 100 nm length at temperature below 300 °C. SEM results revealed that in the case of doped ZnO, the crystallite size varied with increase in dopant concentration. After ascertaining crystallographic phase purity and completing necessary characterization by powder XRD, SEM, and AFM, piezoelectric response of these samples in pellet form was studied at nanometric scale using scanning probe microscopy. In this paper, this enhanced piezoresponse is being correlated with microstructural features.
  • Keywords
    II-VI semiconductors; X-ray diffraction; atomic force microscopy; calcination; copper; crystal microstructure; crystallites; doping profiles; nanofabrication; nanoparticles; nanorods; piezoceramics; piezoelectric semiconductors; scanning electron microscopy; scanning probe microscopy; semiconductor growth; wide band gap semiconductors; zinc compounds; AFM; SEM; ZnO; ZnO:Cu; calcination temperature; ceramic oxides; crystallite size; crystallographic phase purity; dopant concentrations; microstructure; nanocrystalline powders; nanocrystalline zinc oxide; nanodevice fabrication; nanorod formation; nanostructural materials; narrow size distribution; piezoelectric properties; piezoresponse; post-synthesis calcinations; powder XRD; scanning probe microscopy; size 10 nm to 70 nm; size 100 nm; temperature 100 degC to 700 degC; Crystals; Nanostructured materials; Scanning electron microscopy; X-ray scattering; Zinc oxide; Dopant; ZnO; nanocrystalline (nc); piezoelectricity; scanning probe microscopy;
  • fLanguage
    English
  • Journal_Title
    Nanotechnology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1536-125X
  • Type

    jour

  • DOI
    10.1109/TNANO.2013.2277578
  • Filename
    6576264