DocumentCode :
764503
Title :
Shear wave imaging for deep nondestructive evaluation
Author :
Zhang, Dejing ; Crean, G.M.
Author_Institution :
Nat. Microelectron. Res. Centre, Cork, Ireland
Volume :
27
Issue :
24
fYear :
1991
Firstpage :
2248
Lastpage :
2250
Abstract :
Deep subsurface high resolution shear wave imaging using a conventional acoustic microscope and lens is presented. The technique is based on mode conversion phenomena which occur when a focused acoustic beam is incident from water at a material surface. A theoretical framework for the interpretation of the experimental results is discussed. Experimental results are presented using a 50 MHz acoustic lens with a 28 degrees aperture and 11.5 mm working distance in water.
Keywords :
acoustic microscopy; inspection; nondestructive testing; ultrasonic materials testing; 50 MHz; acoustic lens; acoustic microscope; deep nondestructive evaluation; focused acoustic beam; high resolution; mode conversion; subsurface;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19911391
Filename :
109515
Link To Document :
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