Title :
Shear wave imaging for deep nondestructive evaluation
Author :
Zhang, Dejing ; Crean, G.M.
Author_Institution :
Nat. Microelectron. Res. Centre, Cork, Ireland
Abstract :
Deep subsurface high resolution shear wave imaging using a conventional acoustic microscope and lens is presented. The technique is based on mode conversion phenomena which occur when a focused acoustic beam is incident from water at a material surface. A theoretical framework for the interpretation of the experimental results is discussed. Experimental results are presented using a 50 MHz acoustic lens with a 28 degrees aperture and 11.5 mm working distance in water.
Keywords :
acoustic microscopy; inspection; nondestructive testing; ultrasonic materials testing; 50 MHz; acoustic lens; acoustic microscope; deep nondestructive evaluation; focused acoustic beam; high resolution; mode conversion; subsurface;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19911391