• DocumentCode
    764536
  • Title

    Look-Ahead Maximum Likelihood Data Detector for Optical Disk Drives

  • Author

    Sonu, Gene H. ; Kim, Yong-Chun ; Lee, Jae-Shin

  • Author_Institution
    Samsung Electron. Co., SISA, San Jose, CA
  • Volume
    42
  • Issue
    10
  • fYear
    2006
  • Firstpage
    2570
  • Lastpage
    2572
  • Abstract
    A simple maximum likelihood detector is described for system-on-chip (SoC) implementation for optical disk drives. As compared to the Viterbi detector (VD) commonly used for storage devices, this detector offers a solution for the speed bottleneck of the VD and less hardware complexity. Using look-ahead samples eliminates the need for a path memory and also resolves the speed bottleneck so that only a "select" operation is required within a clock cycle by moving the other two operations "add" and "compare" out of a clock cycle loop. Another advantage of this detector is that the target sample values can be constructed at the current sample time. This means that sample error can be estimated with significantly less delay for adaptive control loops. This detector is based on two-dimensional boundary functions, which can be readily derived by a simple procedure for finding a set of error events in the respective signal transition and envelope groups. This detector is currently used in a Samsung DVD super-multi-SoC
  • Keywords
    Viterbi detection; adaptive control; digital versatile discs; maximum likelihood detection; system-on-chip; 2D boundary functions; Samsung DVD super-multi-SoC; Viterbi detector; adaptive control loops; clock cycle loop; look-ahead detector; optical disk drives; partial response maximum likelihood; path memory; storage devices; system-on-chip; Clocks; Delay estimation; Disk drives; Error correction; Hardware; Maximum likelihood detection; Maximum likelihood estimation; Optical detectors; System-on-a-chip; Viterbi algorithm; BD; DVD; Viterbi detector (VD); compact disk (CD); hard-disk drive (HDD); look-ahead detector; partial response maximum likelihood (PRML);
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2006.878622
  • Filename
    1704367