Title :
Sensitive 320 Gbit/s eye diagram measurements via optical sampling with semiconductor optical amplifier-ultrafast nonlinear interferometer
Author :
Kang, Inuk ; Dreyer, K.F.
Author_Institution :
Lucent Technol. Bell Labs., Holmdel, NJ, USA
fDate :
7/10/2003 12:00:00 AM
Abstract :
High bit rate (320 Gbit/s) all-optical eye measurements requiring only milliwatt signal power and 25 fJ sampling pulse energy are reported. The system is based on a semiconductor optical amplifier interferometer with time-domain filtering of the ASE noise.
Keywords :
light interferometers; optical communication; semiconductor optical amplifiers; superradiance; time-domain analysis; 25 fJ; 320 Gbit/s; ASE noise; eye diagram measurements; milliwatt signal power; optical sampling; sampling pulse energy; semiconductor optical amplifier-ultrafast nonlinear interferometer; time-domain filtering;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:20030681
