Title :
Magnetoresistance and Current-Driven Resistance Change Measurements in NiFe Film With a Nanoconstriction
Author_Institution :
Tohoku Univ., Sendai
Abstract :
A nano fabricated planar point contact (PC) in NiFe film showed a magnetoresistance (MR) ratio of about 18%, and it stabilized at about 12%; with both values being much larger than those for the anisotropic MR (AMR) ratio of the film. The measurements of current-driven resistance change in the PC were also performed in which about 10.5% resistance change was observed. The saturated resistances coincided with the typical values in the MR measurements (MR: 12%). These results inspired correlation between MR and domain wall
Keywords :
iron alloys; magnetic thin films; magnetoresistance; magnetostriction; nanotechnology; nickel alloys; point contacts; NiFe; anisotropic magnetoresistance; current-driven resistance change; magnetic confinement; magnetic domains; nanoconstriction; nanotechnology; planar point contact; Anisotropic magnetoresistance; Ballistic magnetoresistance; Current measurement; Electrical resistance measurement; Ion beams; Magnetic domain walls; Magnetic field measurement; Magnetic films; Performance evaluation; Tellurium; Magnetic confinement; magnetic domains; magnetoresistance; nanotechnology;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2006.878855
