Author :
Zhang, J. ; Boiadjieva, N. ; Chulkova, G. ; Deslandes, H. ; Tsman, G. N Gol ; Korneev, Alexander ; Kouminov, P. ; Leibowitz, M. ; Lo, W. ; Malinsky, R. ; Okunev, O. ; Pearlman, A. ; Slysz, W. ; Smirnov, K. ; Tsao, C. ; Verevkin, A. ; Voronov, B. ; Wilsher
Author_Institution :
Dept. of Electr., Univ. of Rochester, NY, USA
Abstract :
The 3.5 nm thick-film, meander-structured NbN superconducting single-photon detectors have been implemented in the CMOS circuit-testing system based on the detection of near-infrared photon emission from switching transistors and have significantly improved the performance of the system. Photon emissions from both p- and n-MOS transistors have been observed.
