Perpendicular Anisotropy in FeCr Sputtered Films

Magnetic thin films of Fe1-xCrx (x = 0.33 to 0.40) with perpendicular magnetization were obtained using the rf sputtering method for the first time. Fe66Cr34 deposited onto an unheated substrate had Ku = 6 × 10⁵ erg/cm³, Ms = 280 emu/cm³ and Hc1 = 700 Oe. Film composition and substrate temperature during film preparation were the most important factors inducing perpendicular anisotropy. X-ray diffraction studies showed that the induction of perpendicular anisotropy was always accompanied by growth of the crystalline phase (Cr-dominant bcc phase). FeCr films also exhibited high corrosion resistivity in an oxidizing environment. FeCr is a candidate material for use in perpendicular magnetic recording.