Title :
Microwave Testing with Millimicrosecond Pulses
Author_Institution :
Bell Telephone Labs. Inc., N.J.
fDate :
7/1/1954 12:00:00 AM
Keywords :
Bandwidth; Circuits; Delay lines; Feedback loop; Frequency synchronization; Laboratories; Oscilloscopes; Pulse amplifiers; Pulse generation; Testing;
Journal_Title :
Communications Systems, Transactions of the IRE Professional Group on
DOI :
10.1109/TCS.1954.1095316
