Title :
Characterization of threshold for single tone maximum likelihood frequency estimation
Author :
James, Ben ; Anderson, Brian D O ; Williamson, Robert C.
Author_Institution :
Dept. of Electr. & Electron. Eng., Imperial Coll. of Sci., Technol. & Med., London, UK
fDate :
4/1/1995 12:00:00 AM
Abstract :
This paper presents a simple and direct approach to understanding the threshold effect associated with maximum likelihood estimation of the frequency of a single complex tone. Motivation for the approach, stemming from known results in the field of phase locked loops, is given. It is shown both theoretically and experimentally that the onset of threshold can be directly characterized by a single, easily computed parameter, namely the Cramer-Rao bound on the phase estimation error variance
Keywords :
error analysis; frequency estimation; maximum likelihood estimation; phase estimation; phase locked loops; signal processing; Cramer-Rao bound; complex tone; phase estimation error variance; phase locked loops; single tone maximum likelihood frequency estimation; threshold effect; Amplitude estimation; Australia; Frequency estimation; Frequency measurement; Helium; Maximum likelihood estimation; Noise measurement; Phase estimation; Phase locked loops; Phase noise;
Journal_Title :
Signal Processing, IEEE Transactions on
