• DocumentCode
    76528
  • Title

    A Low-Power Pilot-DAC Based Column Parallel 8b SAR ADC With Forward Error Correction for CMOS Image Sensors

  • Author

    Chen, Denis Guangyin ; Fang Tang ; Bermak, Amine

  • Author_Institution
    Electron. & Comput. Eng. Dept., Hong Kong Univ. of Sci. & Technol., Hong Kong, China
  • Volume
    60
  • Issue
    10
  • fYear
    2013
  • fDate
    Oct. 2013
  • Firstpage
    2572
  • Lastpage
    2583
  • Abstract
    Successive-Approximation-Register (SAR) Analog- to-Digital Converters (ADC) have been shown to be suitable for low-power applications at aggressively scaled CMOS technology nodes. This is desirable for many mobile and portable applications. Unfortunately, SAR ADCs tend to incur significant area cost and reference loading due to the large capacitor array used in its Digital-to-Analog Converter (DAC). This has traditionally made it difficult to implement large numbers of SAR ADC in parallel. This paper describes a compact 8b SAR ADC measuring only 348 μm×7 μm. It uses a new pilot-DAC (pDAC) technique to reduce the power consumption in its capacitor array; moreover, the accuracy of the pDAC scheme is protected by a novel mixed-signal Forward Error Correction (FEC) algorithm with minimal circuit overhead. Any DAC error made during pDAC operation can be recovered later by an additional switching phase. Prototype measurements in 0.18 μm technology shows that the DAC´s figure-of-merit (FoM) is reduced from 61.3 fJ/step to 39.8 fJ/step by adopting pDAC switching with no apparent deterioration in Fixed-Pattern Noise (FPN) and thermal noise.
  • Keywords
    CMOS image sensors; digital-analogue conversion; forward error correction; low-power electronics; thermal noise; CMOS image sensor; FEC algorithm; FPN; FoM; analog-to-digital converter; capacitor array; column parallel SAR ADC; digital-to-analog converter; figure-of-merit; fixed-pattern noise; mixed-signal forward error correction algorithm; pilot-DAC; power consumption reduction; prototype measurement; size 0.18 mum; size 348 mum; size 7 mum; successive-approximation-register; switching phase; thermal noise; Arrays; Capacitors; Forward error correction; Image sensors; Random access memory; Switches; CMOS image sensor; SAR ADC; error correction;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems I: Regular Papers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1549-8328
  • Type

    jour

  • DOI
    10.1109/TCSI.2013.2244317
  • Filename
    6472261