DocumentCode :
765314
Title :
A Markov random field model-based approach to image interpretation
Author :
Modestino, James W. ; Zhang, Jun
Author_Institution :
Dept. of Electr.-Comput.-Syst. Eng., Rensselaer Polytech. Inst., Troy, NY, USA
Volume :
14
Issue :
6
fYear :
1992
fDate :
6/1/1992 12:00:00 AM
Firstpage :
606
Lastpage :
615
Abstract :
An image is segmented into a collection of disjoint regions that form the nodes of an adjacency graph, and image interpretation is achieved through assigning object labels (or interpretations) to the segmented regions (or nodes) using domain knowledge, extracted feature measurements, and spatial relationships between the various regions. The interpretation labels are modeled as a Markov random field (MRF) on the corresponding adjacency graph, and the image interpretation problem is then formulated as a maximum a posteriori (MAP) estimation rule, given domain knowledge and region-based measurements. Simulated annealing is used to find this best realization or optimal MAP interpretation. This approach also provides a systematic method for organizing and representing domain knowledge through appropriate design of the clique functions describing the Gibbs distribution representing the pdf of the underlying MRF. A general methodology is provided for the design of the clique functions. Results of image interpretation experiments on synthetic and real-world images are described
Keywords :
Markov processes; graph theory; pattern recognition; picture processing; simulated annealing; Markov random field model-based approach; adjacency graph; disjoint regions; domain knowledge; extracted feature measurements; image interpretation; interpretation labels; object labels; pattern recognition; picture processing; real-world images; simulated annealing; spatial relationships; synthetic images; Application software; Biomedical measurements; Design methodology; Image analysis; Image segmentation; Markov random fields; Organizing; Remote sensing; Simulated annealing; Systems engineering and theory;
fLanguage :
English
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher :
ieee
ISSN :
0162-8828
Type :
jour
DOI :
10.1109/34.141552
Filename :
141552
Link To Document :
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