• DocumentCode
    765766
  • Title

    The Effect of GePt Underlayer on the L1_0 Ordering FePt Thin Films

  • Author

    Hsu, C.J. ; Tsai, J.L. ; Hsu, C.W. ; Chen, S.K. ; Chang, W.C.

  • Author_Institution
    Dept. of Mater. Eng., Nat. Chung-Hsing Univ., Taichung
  • Volume
    42
  • Issue
    10
  • fYear
    2006
  • Firstpage
    2900
  • Lastpage
    2902
  • Abstract
    We have explored the effect of GePt underlayer deposition temperature on L10 ordered FePt films. As the deposition temperature of GePt increased from room temperature (RT) to 800degC, the coercively (Hc) of the (GePt/FePt) bilayer increased from 1.1 to 9.1 kOe, which indicated the Ge2Pt3 phase formed at higher deposition temperature and promoted the L10 ordered FePt phase formation. Under the similar process, the single layer FePt coercively was 6.9 kOe. The interlayer diffusion between GePt and FePt cannot be avoided when the GePt underlayer deposited at RT. An interesting island-like microstructure was observed when GePt underlayer deposited at higher temperature
  • Keywords
    coercive force; germanium alloys; iron alloys; magnetic thin films; 800 C; FePt; FePt thin films; GePt; GePt underlayer deposition temperature; coercively; interlayer diffusion; island-like microstructure; phase formation; room temperature; Magnetic anisotropy; Magnetic field measurement; Magnetic films; Microstructure; Perpendicular magnetic anisotropy; Plasma temperature; Radio frequency; Sputtering; Transistors; Vibration measurement; Coercivity;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2006.879965
  • Filename
    1704476