• DocumentCode
    765930
  • Title

    Strongly improved frequency response at high-optical input powers from InGaAsP compensated strain MQW electroabsorption modulators

  • Author

    Sahara, Richard ; Morito, K. ; Sato, K. ; Kotaki, Y. ; Soda, H. ; Okazaki, N.

  • Author_Institution
    Center for Global Partnership, Nat. Sci. Found., Washington, DC, USA
  • Volume
    7
  • Issue
    9
  • fYear
    1995
  • Firstpage
    1004
  • Lastpage
    1006
  • Abstract
    InGaAsP MQW electroabsorption modulators with and without compensated strain were fabricated and tested. Compensated strain was employed to reduce the valence band discontinuity between the well and barrier, which decreased the heavy-hole carrier escape time. A short optical pulse coupled into the modulator was used to measure the enhancement in carrier escape time from strained compensated InGaAsP quantum wells, for the first time. As a result, the strained MQW sample demonstrated an improved frequency response when operated at high optical input powers and low fields.<>
  • Keywords
    III-V semiconductors; deformation; electro-optical modulation; electroabsorption; frequency response; gallium arsenide; gallium compounds; indium compounds; semiconductor quantum wells; InGaAsP; InGaAsP compensated strain MQW electroabsorption modulators; frequency response; heavy-hole carrier escape time; high optical input powers; high-optical input powers; low fields; valence band discontinuity; Capacitive sensors; Frequency response; Optical coupling; Optical modulation; Optical pulses; Pulse measurements; Pulse modulation; Quantum well devices; Testing; Time measurement;
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/68.414683
  • Filename
    414683