Probing the Magnetization Reversal of Microstructured Permalloy Cross by Planar Hall Measurement and Magnetic Force Microscopy

Author

Chang, Y.C. ; Chang, C.C. ; Wu, J.C. ; Wei, Z.H. ; Lai, M.F. ; Chang, C.R.

Author_Institution

Nat. Changhua Univ. of Educ.

Volume

42

Issue

10

fYear

2006

Firstpage

2963

Lastpage

2965

Abstract

A local magnetization reversal of Permalloy cross has been studied by using magnetoresistance measurement and magnetic force microscope. An extraordinary change of the transverse voltage correlated with the planar Hall Effect was presented and evidenced by a series of MFM images which indicates that the rotation of magnetization within the joint area contributes to the significant voltage alteration

Keywords

Hall effect devices; Permalloy; magnetic force microscopy; magnetic recording; magnetisation reversal; magnetoresistance; Hall effect devices; MFM images; magnetic force microscopy; magnetic recording; magnetization reversal; magnetoresistance measurement; microstructured permalloy cross; planar Hall measurement; Anisotropic magnetoresistance; Current measurement; Force measurement; Magnetic anisotropy; Magnetic domain walls; Magnetic field measurement; Magnetic force microscopy; Magnetic forces; Magnetization reversal; Voltage measurement; Hall effect devices; magnetic force microscopy (MFM); magnetic recording; magnetoresistance;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/TMAG.2006.878421

Filename

1704497