• DocumentCode
    766025
  • Title

    Photoinduced refractive-index changes in TiO2-doped silica optical waveguides on silicon substrate

  • Author

    Hibino, Y. ; Abe, M. ; Kominato, T. ; Ohmori, Y.

  • Author_Institution
    NTT Opto-Electron. Labs., Ibaraki, Japan
  • Volume
    27
  • Issue
    24
  • fYear
    1991
  • Firstpage
    2294
  • Lastpage
    2295
  • Abstract
    For the first time, refractive-index changes are described which are due to laser irradiation in a Mach-Zehnder interferometer composed of TiO2-doped silica optical waveguides on an Si substrate. A maximum refractive-index change of about 1.0*10-5 is obtained around 1.5 mu m at an Ar+ laser throughput power of 2.1 W and an irradiation time of 1 h even though the concentration of TiO2 is very low (about 0.3 mol.%).
  • Keywords
    integrated optics; light interferometers; optical waveguides; refractive index; silicon compounds; titanium compounds; 1 hr; 1.5 micron; 2.1 W; Ar + laser; Mach-Zehnder interferometer; Si substrate; SiO 2:TiO 2; TiO 2-doped silica; laser irradiation; optical waveguides; photoinduced refractive-index changes;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19911418
  • Filename
    109541
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=766025