DocumentCode
766048
Title
Preferential Orientation and Magnetic Properties of Sputter-Deposited Fe3 O4 Films
Author
Ohta, S. ; Ohtani, Y. ; Terada, A.
Author_Institution
Ibaraki Electrical Communication Lab., NTT.
Volume
1
Issue
6
fYear
1985
Firstpage
756
Lastpage
758
Abstract
The authors studied the effects of the type of substrate rotation speed on Fe3 O4 films formed by reactive sputtering, varying the layer deposition period D in the range from 2 to 30 Ã
while holding the film deposition rate R and substrate temperature T constant. Smaller periods D resulted in larger crystal grains. Films formed on glass, alumite, and (111) silicon substrates with small D were highly oriented in the ≪111≫ direction, while alignment in the ≪100≫ direction was enhanced in films deposited on (100) NaCl. Also, highly oriented films tended to exhibit high squareness ratios and low coercivities.
Keywords
Coercive force; Glass; Iron; Magnetic films; Magnetic properties; Semiconductor films; Silicon; Sputtering; Substrates; Temperature distribution;
fLanguage
English
Journal_Title
Magnetics in Japan, IEEE Translation Journal on
Publisher
ieee
ISSN
0882-4959
Type
jour
DOI
10.1109/TJMJ.1985.4548941
Filename
4548941
Link To Document