DocumentCode
766207
Title
Neutron sensitivity of the endcap RPC modules in Belle detector
Author
Abe, K. ; Hoshi, Y. ; Nagamine, T. ; Neichi, K. ; Onodera, K. ; Takahashi, T. ; Yamaguchi, A. ; Yuta, H.
Author_Institution
Dept. of Appl. Phys., Tohoku Gakuin Univ., Tagajo, Japan
Volume
50
Issue
4
fYear
2003
Firstpage
831
Lastpage
835
Abstract
The primary purpose in the Belle experiment at the asymmetric-energy e=e- collider at the High-Energy Accelerator Research Organization (KEK B factory) is the measurement of charge conjugation and parity (CP) violation in B meson decays. The KL mesons and muons (KLM) detector was designed to identify KL´s and muons in this experiment. Since October 2001, the luminosity in the KEK B accelerator has been remarkably improved. The data on B meson decay are successfully collected in the Belle detector. In contrast with the high luminosity operations of the accelerator, however, the high background rate leading to a lower detection efficiency has been observed in the endcap KLM detector. For present and future high luminosity operations, we have to identify the background source and consider the shielding. To identify the background source, the background data sampled from e+e-→μ+μ- events were investigated and the simulations of the sensitivity of the endcap KLM detector to neutrons and γ´s as the background sources were performed using the Geant4 simulation toolkit. The comparisons of the simulations with the experimental data are presented.
Keywords
high energy physics instrumentation computing; ionisation chambers; neutron detection; position sensitive particle detectors; Belle detector; Geant4 simulation toolkit; KLM detector; charge conjugation; detection efficiency; endcap RPC modules; high background rate; luminosity; neutron sensitivity; parity; resistive plate counter; Counting circuits; Detectors; Discrete event simulation; Glass; Iron; Mesons; Neutrons; Particle beams; Physics; Production facilities;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.2003.814571
Filename
1221883
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