• DocumentCode
    766369
  • Title

    A new measurement technique for obtaining the complex relative permittivity of terrain surfaces

  • Author

    Kim, Heung-Soo ; Narayanan, Ram M.

  • Author_Institution
    Fac. of Telecommun. & Comput. Engineeging, Cheju Nat. Univ., South Korea
  • Volume
    40
  • Issue
    5
  • fYear
    2002
  • fDate
    5/1/2002 12:00:00 AM
  • Firstpage
    1190
  • Lastpage
    1194
  • Abstract
    A new method for measuring the effective complex relative permittivity of a reflecting surface is presented. The approach is based on the two-ray model. We derive an equation of a circle representing the complex reflection coefficient which relates the incidence angle, frequency, and received power from the path gain using the two-ray model. The intersection point of three such circles at different heights, while maintaining the same incidence angle, yields the correct complex reflection coefficient value. By measuring the received power for both the vertical and horizontal polarizations, the relative permittivity of the surface can be determined. The technique is validated using computer simulation, as well as field measurements of typical terrain surfaces, such as asphalt, grass, and bare soil. A major advantage of this method is that it obviates the need to use antennas with a narrow beam pattern
  • Keywords
    geophysical techniques; radiowave propagation; terrestrial electricity; tropospheric electromagnetic wave propagation; atmosphere; complex permittivity; complex relative permittivity; geoelectric; geophysical measurement technique; incidence angle; land surface; radiowave propagation; reflecting surface; terrain surface; terrestrial electricity; troposphere; two-ray model; Antenna measurements; Computer simulation; Equations; Frequency; Measurement techniques; Optical reflection; Permittivity measurement; Polarization; Power measurement; Soil measurements;
  • fLanguage
    English
  • Journal_Title
    Geoscience and Remote Sensing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0196-2892
  • Type

    jour

  • DOI
    10.1109/TGRS.2002.1010903
  • Filename
    1010903