DocumentCode :
766474
Title :
Unified complete MOSFET model for analysis of digital and analog circuits
Author :
Miura-Mattausch, Mitiko ; Feldmann, Uwe ; Rahm, Alexander ; Bollu, Michael ; Savignac, Dominique
Author_Institution :
Corp. Res. & Dev., Siemens AG, Munich, Germany
Volume :
15
Issue :
1
fYear :
1996
fDate :
1/1/1996 12:00:00 AM
Firstpage :
1
Lastpage :
7
Abstract :
In this paper, we describe a complete MOSFET model developed for circuit simulation based on fully consistent physical concept. The model describes all transistor characteristics as a function of surface potentials, which are calculated iteratively at each applied voltage under the charge-sheet approximation. The key idea of this development is to put as much physics as possible into the equations describing the surface potentials. Since the model includes both the drift and the diffusion contributions, a single equation is valid from the subthreshold to the saturation regions. Contrary to the expectation, the results show that our semi-implicit model including the iteration procedures can even reduce the CPU time significantly in comparison with a conventional model similar to BSIM2 including short-channel effects. This is due to the consistent description of the model equations for all transistor characteristics, which results in more straightforward device equations, once the surface potentials have been computed
Keywords :
MOSFET; circuit analysis computing; computational complexity; semiconductor device models; CPU time reduction; analog circuit analysis; charge-sheet approximation; circuit simulation; digital circuit analysis; iteration procedures; semi-implicit model; surface potentials; transistor characteristics; unified complete MOSFET model; Analog circuits; Capacitance; Central Processing Unit; Circuit analysis; Circuit simulation; MOSFET circuits; Nonlinear equations; Physics; Surface treatment; Voltage;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/43.486267
Filename :
486267
Link To Document :
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