• DocumentCode
    766540
  • Title

    Rapid thermal annealed InGaN/GaN flip-chip LEDs

  • Author

    Chen, W.S. ; Shei, S.C. ; Chang, S.J. ; Su, Y.K. ; Lai, W.C. ; Kuo, C.H. ; Lin, Y.C. ; Chang, C.S. ; Ko, T.K. ; Hsu, Y.P. ; Shen, C.F.

  • Author_Institution
    Dept. of Electr. Eng., Nat. Cheng-Kung Univ., Tainan, Taiwan
  • Volume
    53
  • Issue
    1
  • fYear
    2006
  • Firstpage
    32
  • Lastpage
    37
  • Abstract
    Nitride-based flip-chip (FC) light-emitting diodes (LEDs) emitting at 465 nm with Ni transparent ohmic contact layers and Ag reflective mirrors were fabricated. With an incident light wavelength of 465 nm, it was found that transmittance of normalized 300°C rapid thermal annealed (RTA) Ni(2.5 nm) was 93% while normalized reflectance of 300°C RTA Ni(2.5 nm)/Ag(200 nm) was 92%. It was also found that 300°C RTA Ni(2.5 nm) formed good ohmic contact on n+ short-period-superlattice structure with specific contact resistance of 7.8×10-4 Ω·cm2. With 20-mA current injection, it was found that forward voltage and output power were 3.15 V and 16.2 mW for FC LED with 300°C RTA Ni(2.5 nm)/Ag(200 nm). Furthermore, it was found that reliabilities of FC LEDs were good.
  • Keywords
    III-V semiconductors; contact resistance; flip-chip devices; gallium compounds; indium compounds; light emitting diodes; nickel; rapid thermal annealing; silver; wide band gap semiconductors; 300 C; 465 nm; Ag; InGaN-GaN; Ni; contact resistance; current injection; nitride-based flip-chip light emitting diodes; normalized reflectance; rapid thermal annealing; reflective mirror; superlattice; transmittance; transparent ohmic contact layer; Conducting materials; Fluorescent lamps; Gallium nitride; Gold; Indium tin oxide; Light emitting diodes; Mirrors; Ohmic contacts; Power generation; Rapid thermal annealing; Flip-chip (FC); GaN; light-emitting diodes (LEDs); rapid thermal anneal (RTA); reflective mirrors; transparent ohmic contact;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2005.860760
  • Filename
    1561542