Realizations and comparisons of Josephson array voltage standards

Author

Witt, Thomas J.

Author_Institution

Bur. Int. des Poids et Mesures, Sevres, France

Volume

44

Issue

2

fYear

1995

fDate

4/1/1995 12:00:00 AM

Firstpage

208

Lastpage

210

Abstract

This paper reviews implementations of reference standards of voltage based on arrays of Josephson junctions and efforts to compare standards of different laboratories. Estimates of total uncertainty in laboratory realizations range from a few parts in 10⁷ to a few parts in 10¹⁰. The higher values of uncertainty are mainly due to limitations of secondary standards. These limitations are removed when standards are compared using a transportable Josephson array voltage standard, as demonstrated by the comparisons carried out by the BIPM. The comparison results show that the Josephson voltage standards of nine national metrology laboratories agree to better than 1 part in 10⁹

Keywords

laboratories; laboratory techniques; measurement standards; superconducting device testing; voltage measurement; BIPM; Josephson array voltage standards; Josephson junctions; frequency stability; leakage resistance; national metrology laboratories; reference standards; thermal EMF; total uncertainty; transportable Josephson array voltage standard; Frequency measurement; Integrated circuit measurements; Josephson junctions; Laboratories; Measurement standards; Measurement uncertainty; Metrology; Microwave antenna arrays; Standards publication; Voltage;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.377812

Filename

377812