DocumentCode :
766623
Title :
U.S. intercomparison of Josephson array voltage standards
Author :
Rodriguez, Kathleen M. ; Huntley, Les
Author_Institution :
Eastman Kodak Co., Rochester, NY, USA
Volume :
44
Issue :
2
fYear :
1995
fDate :
4/1/1995 12:00:00 AM
Firstpage :
215
Lastpage :
218
Abstract :
In the Summer and Fall of 1993, ten laboratories participated in an intercomparison of their 10 V Josephson array standards. The transfer standards were circulated in a “daisy” pattern to minimize the time difference between the pivot laboratory and participant laboratories, thus minimizing the effect of long-term transfer standard noise. The results were encouraging. With the assumption of a group mean equal to 10 V exactly, all laboratories were within 25 ppb of the group mean. Errors this small are more than adequate for supporting any existing equipment. Further analysis of data shows very small systematic errors, most likely caused by thermal emfs generated by above ambient temperatures on the transfer standard output connectors. We describe the experiment, present the results, and discuss implications for future round robins and laboratory proficiency testing
Keywords :
calibration; measurement standards; superconducting device testing; voltage measurement; 10 V; Josephson array voltage standards; U.S. intercomparison; daisy pattern; errors; laboratory proficiency testing; long-term transfer standard noise; participant laboratories; pivot laboratory; round robins; systematic errors; thermal emfs; time difference; transfer standards; Data analysis; Instruments; Laboratories; Measurement standards; NIST; Noise measurement; Particle measurements; Testing; Uncertainty; Voltage;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/19.377814
Filename :
377814
Link To Document :
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