Title :
Characterization of electrostatically coupled microcantilevers
Author :
Napoli, Mariateresa ; Zhang, Wenhua ; Turner, Kimberly ; Bamieh, Bassam
Author_Institution :
Dept. of Mech. Eng., Univ. of California, Santa Barbara, CA, USA
fDate :
4/1/2005 12:00:00 AM
Abstract :
The use of tightly packed arrays of probes can achieve the much desirable goal of increasing the throughput of scanning probe devices. However the proximity of the probes induces coupling in their dynamics, which increases the complexity of the overall device. In this paper we analyze and model the behavior of a pair of electrostatically and mechanically coupled microcantilevers. For the common case of periodic driving voltage, we show that the underlying linearized dynamics are governed by a pair of coupled Mathieu equations. We provide experimental evidence that confirms the validity of the mathematical model proposed, which is verified by finite element simulations as well. The coefficients of electrostatic and mechanical coupling are estimated respectively by frequency identification methods and noise analysis. Finally, we discuss parametric resonance for coupled oscillators and include a mapping of the first order coupled parametric resonance region.
Keywords :
finite element analysis; microactuators; oscillators; scanning probe microscopy; coupled Mathieu equations; coupled oscillators; device complexity; electrostatic coupling; electrostatically actuation; electrostatically coupled microcantilevers; finite element simulation; frequency identification method; linearized dynamics; mechanical coupling; mechanically coupled microcantilevers; multiprobe devices; noise analysis; parametric resonance region; probe arrays; scanning probe devices; system identification; Coupled mode analysis; Electrostatic analysis; Equations; Finite element methods; Frequency estimation; Mathematical model; Probes; Resonance; Throughput; Voltage; Electrostatically actuated microcantilevers; multiprobe devices; parametric resonance; system identification;
Journal_Title :
Microelectromechanical Systems, Journal of
DOI :
10.1109/JMEMS.2004.839349