Title :
Comparisons of 10-V Josephson array voltage standards between the BNM/LCIE and the BIPM
Author :
Lo-Hive, J.P. ; Reymann, D. ; Genevès, G.
Author_Institution :
BNM/LCIE, Fintenay-aux-Roses, France
fDate :
4/1/1995 12:00:00 AM
Abstract :
A comparison of the 10 V Josephson array voltage standards of the BNM/LCIE and of the BIPM has been carried out. An indirect comparison using Zener-diode based voltage references as transfer standards shows an agreement of 5 parts in 109 with an uncertainty (1σ) of the same value. On-site indirect and direct comparisons show no difference between the two standards within the total uncertainty of 1.2 parts in 1010
Keywords :
measurement standards; superconducting device testing; voltage measurement; 10 V; BIPM; BNM/LCIE; Josephson array voltage standards; Zener-diode; indirect comparison; onsite direct comparisons; onsite indirect comparisons; transfer standards; uncertainty; voltage references; Battery charge measurement; Counting circuits; Detectors; Dielectric losses; Laboratories; NIST; Niobium; Uncertainty; Video recording; Voltage;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
