Title :
Performance and reliability of NIST 10-V Josephson arrays
Author :
Hamilton, C.A. ; Burroughs, C.J.
Author_Institution :
Nat. Inst. of Stand. & Technol., Boulder, CO, USA
fDate :
4/1/1995 12:00:00 AM
Abstract :
This paper reviews eight years of fabrication of 10-V Josephson array chips at NIST, and the performance and reliability of these chips at 22 different standards laboratories. Failure mechanisms and statistical data on failure rates are presented for devices made with both Nb/Nb2O5/Pb and Nb/Al2O3/Nb junctions
Keywords :
aluminium compounds; measurement standards; niobium; niobium compounds; reliability; superconducting device testing; voltage measurement; 10 V; Josephson arrays; NIST; Nb-Al2O3-Nb; Nb-Nb2O5-Pb; Nb/Al2O3/Nb junctions; Nb/Nb2O5/Pb junctions; failure mechanisms; reliability; statistical data; Critical current; Fabrication; Helium; Humidity; Laboratories; Moisture; NIST; Niobium; Stability; Voltage;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
