• DocumentCode
    76668
  • Title

    An Analytical Framework for Evaluating the Error Characteristics of Approximate Adders

  • Author

    Cong Liu ; Jie Han ; Lombardi, Fabrizio

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Alberta, Edmonton, AB, Canada
  • Volume
    64
  • Issue
    5
  • fYear
    2015
  • fDate
    May 1 2015
  • Firstpage
    1268
  • Lastpage
    1281
  • Abstract
    Approximate adders have been considered as a potential alternative for error-tolerant applications to trade off some accuracy for gains in other circuit-based metrics, such as power, area and delay. Existing approximate adder designs have shown substantial advantages in improving many of these operational features. However, the error characteristics of the approximate adders still remain an issue that is not very well understood. A simulation-based method requires both programming efforts and a time-consuming execution for evaluating the effect of errors. This method becomes particularly expensive when dealing with various sizes and types of approximate adders. In this paper, a framework based on analytical models is proposed for evaluating the error characteristics of approximate adders. Error features such as the error rate and the mean error distance are obtained using this framework without developing functional models of the approximate adders for time-consuming simulation. As an example, the estimate of peak signal-to-noise ratios (PSNRs) in image processing is considered to show the potential application of the proposed analysis. This analytical framework provides an efficient method to evaluate various designs of approximate adders for meeting different figures of merit in error-tolerant applications.
  • Keywords
    adders; approximation theory; image processing; PSNR; approximate adders; circuit-based metrics; error characteristics; error-tolerant applications; image processing; peak signal-to-noise ratios; simulation-based method; time-consuming execution; Accuracy; Adders; Computational modeling; Erbium; Error analysis; Measurement; PSNR; Approximate computing; PSNR estimate; approximate adder; image processing; mean error distance;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/TC.2014.2317180
  • Filename
    6797866