DocumentCode :
766778
Title :
Frequency dependence of 100-Ω standard resistors measured with a CCC-based AC resistance bridge
Author :
Seppä, H. ; Satrapinski, A. ; Varpula, T. ; Saari, J.-M.
Author_Institution :
Meas. Technol., VTT Autom., Finland
Volume :
44
Issue :
2
fYear :
1995
fDate :
4/1/1995 12:00:00 AM
Firstpage :
276
Lastpage :
280
Abstract :
This paper describes the frequency dependence of three 100-Ω standard resistors in the frequency range from 0.1 Hz to 1 Hz. The measurements were carried out with an automated AC bridge based on the cryogenic current comparator (CCC) and a DC SQUID null detector. A GaAs Quantum-Hall resistance (QHR) cooled down to 1.4-1.8 K was used as a reference. The error sources related to the AC bridge and the quantum-Hall component are analyzed in detail. The kinetic inductance in the QHR is found to have an important role in ac measurements. The ac bridge has a very high sensitivity, providing a resolution of 1 ppb for a current of 40 μA at 1 Hz, with a 5 min averaging time. The plateau i=2 was obtained at 7.4 T. Some resistors, such as an NBS type 100 Ω (L&N), reveal a strong frequency dependence below 1 Hz. The frequency dependence of the Wilkins type 100 Ω (Tinsley) is reasonably small, and a film resistor (ZIP) shows no significant frequency dependence. Thus the frequency dependence of the standard resistors cannot, in general, be neglected, and an accurate measurement of the dependence is necessary for the determination of the value of the resistance. In addition, all the precise resistance measurements should be performed with a sinusoidal current in order to make the interpretation of the results less ambiguous
Keywords :
SQUIDs; bridge circuits; bridge instruments; cryogenic electronics; current comparators; electric resistance measurement; measurement standards; quantum Hall effect; resistors; thin film resistors; 0.1 to 1 Hz; 1 Hz; 1.4 to 1.8 K; 100 ohm; 40 mA; 5 min; AC resistance bridge; DC SQUID null detector; GaAs Quantum-Hall resistance; Wilkins type; compensation; cryogenic current comparator; error sources; film resistor; frequency dependence; sinusoidal current; standard resistors; uncertainty; Bridges; Cryogenics; Current measurement; Detectors; Electrical resistance measurement; Frequency dependence; Frequency measurement; Measurement standards; Resistors; SQUIDs;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/19.377830
Filename :
377830
Link To Document :
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