DocumentCode
766803
Title
Reflectometer calibration using planar NiCr thin-film resistors and an open circuit
Author
Stumper, Ulrich
Author_Institution
Physikalisch Tech. Bundesanstalt, Braunschweig, Germany
Volume
44
Issue
2
fYear
1995
fDate
4/1/1995 12:00:00 AM
Firstpage
288
Lastpage
290
Abstract
A method for determining the three error-box parameters of complex reflectometers is reported. A set of planar NiCr thin-film resistors mounted in identical coaxial connectors and only an open circuit are used. A comparison of reflection measurements obtained with the new method with measurements obtained using the “quarter wavelength” technique shows good agreement between results in the megahertz range
Keywords
calibration; chromium alloys; electric resistance measurement; measurement standards; nickel alloys; reflectometers; thin film resistors; MHz range; NiCr; NiCr thin-film resistors; complex reflectometers; identical coaxial connectors; open circuit; quarter wavelength technique; reflection measurements; reflectometer calibration; three error-box parameters; Admittance; Calibration; Coaxial components; Connectors; Equations; Measurement standards; Reflection; Resistors; Thin film circuits; Wavelength measurement;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/19.377833
Filename
377833
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