DocumentCode :
766807
Title :
Special issue on smart power device reliability
Volume :
53
Issue :
1
fYear :
2006
Firstpage :
178
Lastpage :
178
Abstract :
Provides notice of upcoming special issues of interest to practitioners and researchers.
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2005.863018
Filename :
1561565
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=766807
