Microcantilever Torque Magnetometry Study of Patterned Magnetic Films

Author

Yuan, L. ; Gao, L. ; Sabirianov, R. ; Liou, S.H. ; Chabot, M.D. ; Min, D.H. ; Moreland, J. ; Han, Bao Shan

Author_Institution

Dept. of Phys. & Astron., Nebraska Univ.

Volume

42

Issue

10

fYear

2006

Firstpage

3234

Lastpage

3236

Abstract

Microcantilever torque magnetometry (MTM) is a sensitive tool to measure small magnetization changes in the sample. In this paper, we investigated a process for preparing patterned magnetic films on cantilevers and studied the magnetic interactions of a single pair of micrometer-sized Ni₈₀Fe₂₀ bars (7 mum times 3.5 mum times 30 nm) separated by 50 nm using MTM. The bars were prepared with focused ion-beam milling. The magnetic hysteresis loops show that the switching field of a single bar is larger than the reversing field of only one of the paired bars and less than that of both paired bars. This clearly indicates that the magnetostatic interaction exists between the bars

Keywords

cantilevers; iron alloys; magnetic thin films; magnetometers; nickel alloys; MTM; Ni₈₀Fe₂₀; focused ion-beam milling; magnetization changes; magnetization reversal; microcantilever torque magnetometry; patterned magnetic films; Bars; Iron; Magnetic films; Magnetic hysteresis; Magnetic separation; Magnetic switching; Magnetization; Magnetostatics; Milling; Torque measurement; Magnetization reversal; torque magnetometers;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/TMAG.2006.878424

Filename

1704584