• DocumentCode
    767035
  • Title

    On the robustness of the class of stack filters

  • Author

    Shmulevich, Ilya ; Yli-Harja, Olli ; Astola, Jaakko ; Korshunov, Aleksey

  • Author_Institution
    Signal Process. Lab., Tampere Univ. of Technol., Finland
  • Volume
    50
  • Issue
    7
  • fYear
    2002
  • fDate
    7/1/2002 12:00:00 AM
  • Firstpage
    1640
  • Lastpage
    1649
  • Abstract
    A widely held view in the nonlinear signal processing community is that the class of stack filters is robust. Although this is supported by extensive experimental evidence, no systematic theoretical justification exists, despite the availability of analytical tools for studying robustness of individual stack filters. We focus on rank selection probabilities (RSPs) as measures of robustness as it is well known that other statistical characterizations of stack filters, such as output distributions, breakdown probabilities and output distributional influence functions can be represented in terms of RSPs. We show, in a very general sense, that the class of stack filters is highly robust. It is also shown that almost all stack filters have very similar output distributions for independent and identically distributed (i.i.d.) input signals and, thus, very similar statistical behavior
  • Keywords
    Boolean functions; circuit optimisation; filtering theory; probability; stack filters; statistical analysis; breakdown probabilities; i.i.d. input signals; independent identically distributed input signals; monotone Boolean functions; nonlinear signal processing; optimization; output distributional influence functions; output distributions; robustness measure; selection probabilities; stack filters; statistical behavior; statistical characteristics; Band pass filters; Design methodology; Design optimization; Electric breakdown; Filtering theory; Nonlinear filters; Probability; Robustness; Signal processing; Statistics;
  • fLanguage
    English
  • Journal_Title
    Signal Processing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1053-587X
  • Type

    jour

  • DOI
    10.1109/TSP.2002.1011205
  • Filename
    1011205