• DocumentCode
    76720
  • Title

    Graphene as a Diffusion Barrier in Galinstan-Solid Metal Contacts

  • Author

    Ahlberg, Patrik ; Seung Hee Jeong ; Mingzhi Jiao ; Zhigang Wu ; Jansson, Ulf ; Shi-Li Zhang ; Zhi-Bin Zhang

  • Author_Institution
    Dept. of Eng. Sci., Uppsala Univ., Uppsala, Sweden
  • Volume
    61
  • Issue
    8
  • fYear
    2014
  • fDate
    Aug. 2014
  • Firstpage
    2996
  • Lastpage
    3000
  • Abstract
    This paper presents the use of graphene as a diffusion barrier to a eutectic Ga-In-Sn alloy, i.e., galinstan, for electrical contacts in electronics. Galinstan is known to be incompatible with many conventional metals used for electrical contacts. When galinstan is in direct contact with Al thin films, Al is readily dissolved leading to the formation of Al oxides present on the surface of the galinstan droplets. This reaction is monitored ex situ using several material analysis methods as well as in situ using a simple circuit to follow the time-dependent resistance variation. In the presence of a multilayer graphene diffusion barrier, the Al-galinstan reaction is effectively prevented for galinstan deposited by means of drop casting. When deposited by spray coating, the high-impact momentum of the galinstan droplets causes damage to the multilayer graphene and the Al-galinstan reaction is observed at some defective spots. Nonetheless, the graphene barrier is likely to block the formation of Al oxides at the Al/galinstan interface leading to a stable electrical current in the test circuit.
  • Keywords
    diffusion barriers; electrical contacts; eutectic alloys; gallium alloys; graphene; indium alloys; tin alloys; C; GaInSn-Al; Galinstan-solid metal contacts; diffusion barrier; electrical contacts; eutectic alloy; graphene; high impact momentum; spray coating; time dependent resistance variation; Coatings; Contacts; Glass; Graphene; Metals; Resistance; Surface treatment; Contact; diffusion barrier; galinstan; graphene; graphene.;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2014.2331893
  • Filename
    6847176