• DocumentCode
    76721
  • Title

    Issues in Modeling Amorphous Silicon Photovoltaic Modules by Single-Diode Equivalent Circuit

  • Author

    Lineykin, Simon ; Averbukh, M. ; Kuperman, A.

  • Author_Institution
    Dept. of Mech. Eng. & Mechatron., Ariel Univ., Ariel, Israel
  • Volume
    61
  • Issue
    12
  • fYear
    2014
  • fDate
    Dec. 2014
  • Firstpage
    6785
  • Lastpage
    6793
  • Abstract
    In this paper, the applicability of the well-known single-diode equivalent circuit to modeling amorphous silicon photovoltaic modules is questioned. It is shown that, unlike in mono- and polycrystalline modules, all of the equivalent circuit parameters are irradiation dependent. This dependence may be derived from either manufacturer-provided or measured I-V curves for different irradiation levels. In order to extract the equivalent circuit parameters, the suggested approach combines numerical solution of two transcendental and two regular algebraic equation systems with single-parameter fitting procedure. Two additional parameters are introduced to describe temperature dependence of photocurrent and diode reverse saturation current. As result, a set of seven parameters is obtained, comprehensively describing the panel performance for arbitrary ambient conditions. It is shown that characteristic curves obtained using the proposed approach match well the manufacturer-provided data for various values of temperature and irradiation.
  • Keywords
    amorphous semiconductors; equivalent circuits; semiconductor diodes; silicon; solar cells; amorphous silicon photovoltaic modules; characteristic curves; diode reverse saturation current; equivalent circuit parameter extraction; regular algebraic equation systems; single-diode equivalent circuit; single-parameter fitting procedure; transcendental algebraic equation systems; Amorphous silicon; Equivalent circuits; Integrated circuit modeling; Photovoltaic systems; Radiation effects; Amorphous silicon photovoltaics; single-diode equivalent circuit; solar panel modeling;
  • fLanguage
    English
  • Journal_Title
    Industrial Electronics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0046
  • Type

    jour

  • DOI
    10.1109/TIE.2014.2317138
  • Filename
    6797870