DocumentCode
767239
Title
Noise performance and chopper frequency in integrated micromachined chopper-detectors in silicon
Author
Wolffenbuttel, R.F. ; de Graaf, G.
Author_Institution
Dept. of Electr. Eng., Delft Univ. of Technol., Netherlands
Volume
44
Issue
2
fYear
1995
fDate
4/1/1995 12:00:00 AM
Firstpage
451
Lastpage
453
Abstract
The noise behavior of the basic transimpedance amplifier has been investigated in the frequency range in between 100 kHz and 1 MHz. At frequencies below 10 kHz JFET-based operational amplifiers are preferred, because of the low equivalent input current noise that dominates overall noise performance. At frequencies beyond 10 MHz circuits with a bipolar input stage are generally used, because the equivalent input voltage dominates noise performance due to the capacitive source impedance of the photodiode at such frequencies. The transitional frequency range indicated has become important due to the increased operating frequency of optical choppers. It will be shown that a transimpedance amplifier with a bipolar input stage is preferred at intermediate frequencies and that the noise performance limits the operating frequency in an integrated micromechanical chopper rather than its inertia
Keywords
JFET circuits; JFET integrated circuits; bipolar integrated circuits; choppers (circuits); elemental semiconductors; microsensors; operational amplifiers; photodetectors; photodiodes; semiconductor device noise; silicon; 10 MHz; 10 kHz; 100 kHz to 1 MHz; JFET-based operational amplifiers; Si; bipolar input stage; capacitive source impedance; chopper frequency; equivalent input voltage; integrated micromachined chopper-detectors; integrated micromechanical chopper; intermediate frequencies; noise performance; overall noise performance; photodiode; transimpedance amplifier; transitional frequency range; Choppers; Circuit noise; Frequency; Impedance; Low-noise amplifiers; Operational amplifiers; Optical amplifiers; Optical noise; Photodiodes; Voltage;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/19.377877
Filename
377877
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