• DocumentCode
    76734
  • Title

    Characterizing the Effects of Single Event Upsets on Synchronous Data Paths

  • Author

    Berg, Markus ; Friendlich, Mark ; Hak Kim ; Seidlick, Christina ; LaBel, Kenneth ; Ladbury, Ray ; Pellish, Jonathan

  • Author_Institution
    MEI Technol., NASA Goddard Space Flight Center, Greenbelt, MD, USA
  • Volume
    60
  • Issue
    4
  • fYear
    2013
  • fDate
    Aug. 2013
  • Firstpage
    2697
  • Lastpage
    2703
  • Abstract
    We present a Single Event Upset (SEU) model with supporting data demonstrating frequency effects that deviate from conventional theory. The model emphasizes design topology versus circuit-element contributions to SEU cross sections.
  • Keywords
    field programmable gate arrays; logic design; radiation hardening (electronics); REAG FPGA SEU model; circuit-element contribution; conventional theory; design topology; frequency effect; single event upset model; synchronous data paths; Analytical models; Clocks; Data models; Logic gates; Single event upsets; Synchronization; Topology; Error prediction; mitigation; single event effects; synchronous design;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2013.2273938
  • Filename
    6576296
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=76734