Title :
Characterizing the Effects of Single Event Upsets on Synchronous Data Paths
Author :
Berg, Markus ; Friendlich, Mark ; Hak Kim ; Seidlick, Christina ; LaBel, Kenneth ; Ladbury, Ray ; Pellish, Jonathan
Author_Institution :
MEI Technol., NASA Goddard Space Flight Center, Greenbelt, MD, USA
Abstract :
We present a Single Event Upset (SEU) model with supporting data demonstrating frequency effects that deviate from conventional theory. The model emphasizes design topology versus circuit-element contributions to SEU cross sections.
Keywords :
field programmable gate arrays; logic design; radiation hardening (electronics); REAG FPGA SEU model; circuit-element contribution; conventional theory; design topology; frequency effect; single event upset model; synchronous data paths; Analytical models; Clocks; Data models; Logic gates; Single event upsets; Synchronization; Topology; Error prediction; mitigation; single event effects; synchronous design;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2013.2273938
