• DocumentCode
    767400
  • Title

    An experimental single-chip data flow CPU

  • Author

    Uvieghara, Gregory A. ; Hwu, Wen-Mei W. ; Nakagome, Yoshinobu ; Jeong, Deog-Kyoon ; Lee, David D. ; Hodges, David A. ; Patt, Yale N.

  • Author_Institution
    AT&T Bell Lab., Holmdel, NJ, USA
  • Volume
    27
  • Issue
    1
  • fYear
    1992
  • fDate
    1/1/1992 12:00:00 AM
  • Firstpage
    17
  • Lastpage
    28
  • Abstract
    HPSm (high-performance substrate) is a single-chip data flow CPU. It enhances throughput by using three function units to exploit parallelism, while executing RISC instructions in a data-driven manner to keep the function units busy. HPSm is data driven in the sense that instructions whose operands are not ready are not permitted to stall the machine by blocking subsequent ones. It uses branch prediction to exploit concurrency between blocks of code, and is capable of operating at a peak performance of 30 MIPS while running at only 10 MHz. It employs four on-chip smart memories to control the data-driven execution on the three function units, and to support branch prediction and exception handling. Simulations indicate that HPSm achieves significant speedup over a single-chip RISC microarchitecture implemented with the same fabrication technology and clock cycle. The HPSm chip is designed for a 1.6-μm double-metal scalable CMOS process. It contains 87279 transistors, occupies an area of 13.83 mm×13.04 mm, and is estimated to dissipate 2 W at 10 MHz
  • Keywords
    CMOS integrated circuits; VLSI; microprocessor chips; parallel architectures; reduced instruction set computing; 1.6 micron; 10 MHz; 13.83 mm; 2 W; 30 MIPS; HPSm chip; RISC instructions; branch prediction; concurrency between blocks of code; data-driven execution; double-metal scalable CMOS process; exception handling; high-performance substrate; on-chip memories; parallelism; peak performance; single-chip data flow CPU; smart memories; speedup; three function units; CMOS process; CMOS technology; Clocks; Concurrent computing; Fabrication; Laboratories; Microarchitecture; Out of order; Reduced instruction set computing; Throughput; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/4.109554
  • Filename
    109554