Title :
Mass spectrometry at 0.1 part per billion for fundamental metrology
Author :
DiFilippo, Frank ; Natarajan, Vasant ; Bradley, Michael ; Palmer, Fred ; Rusinkiewicz, Szymon ; Pritchard, David E.
Author_Institution :
Res. Lab. of Electron., MIT, Cambridge, MA, USA
fDate :
4/1/1995 12:00:00 AM
Abstract :
The single ion Penning trap mass spectrometer at M.I.T. now compares masses with an accuracy of 0.1 part per billion. We have created a table of fundamental atomic masses and made measurements useful for calibrating the X-ray wavelength standard, and determining Avogadro´s number, the molar Planck constant, and the fine structure constant
Keywords :
atomic mass; calibration; constants; fine structure; mass measurement; mass spectrometers; mass spectroscopy; measurement standards; particle traps; Avogadro´s number; M.I.T.; X-ray wavelength standard; calibration; fine structure constant; fundamental atomic masses; mass spectrometry; molar Planck constant; single ion Penning trap mass spectrometer; Atomic measurements; Cyclotrons; Electrostatic measurements; Frequency measurement; Magnetic field measurement; Mass spectroscopy; Metrology; Motion measurement; Time measurement; Wavelength measurement;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
