Mass spectrometry at 0.1 part per billion for fundamental metrology

Author

DiFilippo, Frank ; Natarajan, Vasant ; Bradley, Michael ; Palmer, Fred ; Rusinkiewicz, Szymon ; Pritchard, David E.

Author_Institution

Res. Lab. of Electron., MIT, Cambridge, MA, USA

Volume

Issue

fYear

1995

fDate

4/1/1995 12:00:00 AM

Firstpage

550

Lastpage

552

Abstract

The single ion Penning trap mass spectrometer at M.I.T. now compares masses with an accuracy of 0.1 part per billion. We have created a table of fundamental atomic masses and made measurements useful for calibrating the X-ray wavelength standard, and determining Avogadro´s number, the molar Planck constant, and the fine structure constant

Keywords

atomic mass; calibration; constants; fine structure; mass measurement; mass spectrometers; mass spectroscopy; measurement standards; particle traps; Avogadro´s number; M.I.T.; X-ray wavelength standard; calibration; fine structure constant; fundamental atomic masses; mass spectrometry; molar Planck constant; single ion Penning trap mass spectrometer; Atomic measurements; Cyclotrons; Electrostatic measurements; Frequency measurement; Magnetic field measurement; Mass spectroscopy; Metrology; Motion measurement; Time measurement; Wavelength measurement;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.377904

Filename

377904

Link To Document

https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=767542