Title :
SMILETRAP-a wide-range high-precision mass spectrometer
Author :
Carlberg, C. ; Bergstrom, Ilias ; Bollen, G. ; Borgenstrand, H. ; Jertz, R. ; Kluge, H.-J. ; Rouleau, G. ; Schuch, R. ; Schwarz, T. ; Schweikhard, L. ; Senne, P. ; Soderberg, F.
Author_Institution :
Dept. of Atomic Phys., Stockholm Univ., Sweden
fDate :
4/1/1995 12:00:00 AM
Abstract :
The capture of externally produced highly charged ions in a Penning trap and the observation of their cyclotron frequencies is described. The ions were produced in an electron beam ion source at a 2.8 kV potential. Injection was made possible by a pretrap, in which these ions were first captured at 2.8 kV and then lowered down to ground potential which allowed transfer (at 1 kV) and capture in the measurement trap at 0 V, The first mass comparisons were made between different charge states of the same nuclei, that is, O8+/O 7+, Ar14+/Ar13+,and Ar17+/Ar 16+. Comparison s between different nuclei, Ar13+,14+,15+,16+/H22+, were also made. First tests of accuracy indicates uncertainties smaller than 10-8
Keywords :
Penning ion sources; Penning ionisation; argon; hydrogen ions; ion sources; mass measurement; mass spectra; mass spectrometer accessories; mass spectroscopy; oxygen; particle traps; positive ions; 0 V; 1 kV; 2.8 kV; Ar; Ar-H2; Ar13+,14+,15+,16+/H22+; Ar14+/Ar13+; Ar17+/Ar16+; O; O8+/O7+; Penning trap; SMILETRAP; charge states; cyclotron frequencies; electron beam ion source; high-precision mass spectrometer; highly charged ions; mass comparison; multiply charged ions; pretrap; uncertainties; Argon; Charge measurement; Current measurement; Cyclotrons; Electron beams; Electron traps; Frequency; Ion sources; Mass spectroscopy; Nuclear measurements;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
