DocumentCode :
767997
Title :
Model-based reliability analysis
Author :
Bierbaum, Rene L. ; Brown, Thomas D. ; Kerschen, Thomas J.
Author_Institution :
Sandia Nat. Labs., Livermore, CA, USA
Volume :
51
Issue :
2
fYear :
2002
fDate :
6/1/2002 12:00:00 AM
Firstpage :
133
Lastpage :
140
Abstract :
Testing has typically been a key means of detecting anomalous performance and of providing a foundation for estimating reliability for weapon systems. The objective of model-based reliability analysis (MBRA) is to identify ways to capitalize on the insights gained from physical-response modeling both to supplement the information obtained from testing and to better-understand test results. Five general MBRA processes are identified which can capitalize on physical response modeling results to make both quantitative and qualitative statements about product reliability. A case study that explores 1 of these 5 processes was completed and is described in detail. It had the benefits: MBRA can be used to determine a performance baseline against which current and future test results can be compared; during the design process, MBRA can provide tradeoff studies such that development time and required test assets can be reduced; MBRA can be used to evaluate the impact of production and part changes, as well as aging degradation, if they arise during the product life cycle; and MBRA lays the foundation to evaluate anomalies that are observed in a test program. Typically it has been challenging to determine how anomalous behavior can manifest itself under different-but still valid-conditions. One can use modeling to inject hypothesized behaviors under different conditions and observe the consequences
Keywords :
reliability theory; weapons; CAD; CAE; CAM; CIM; SPICE; aging degradation; anomalous performance detection; design margin; electrical modeling; hypothesized behaviors; life prediction; model-based reliability analysis; part changes; performance baseline; physical response modeling; product reliability; production changes; reliability estimation; test assets reduction; tradeoff studies; weapon systems; Bit error rate; Failure analysis; Integrated circuit modeling; Integrated circuit reliability; Laboratories; Life testing; Predictive models; SPICE; Signal analysis; Weapons;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/TR.2002.1011517
Filename :
1011517
Link To Document :
بازگشت