DocumentCode
768320
Title
Temperature and stress time history responses in electronic packaging
Author
Lau, John H.
Author_Institution
Express Packaging Syst. Inc., Palo Alto, CA, USA
Volume
19
Issue
1
fYear
1996
fDate
2/1/1996 12:00:00 AM
Firstpage
248
Lastpage
254
Abstract
The closed-form thermoelasticity solutions of electronic packages subjected to an instantaneous source of heat, and a heat source varying harmonically as function of time, are presented. Useful curves and charts which relate the variables, time, frequency, heat, temperature, stress, displacement, and material property are also provided for engineering practice convenience. Also, the present results can be used to verify finite element analysis procedures and interpret experimental data
Keywords
deformation; finite element analysis; packaging; thermal analysis; thermal stresses; thermoelasticity; closed-form thermoelasticity solutions; displacement; electronic packaging; finite element analysis; frequency; heat; material property; stress time history response; temperature; time; Electronic packaging thermal management; Electronics packaging; Frequency; History; Poisson equations; Space heating; Temperature distribution; Thermal conductivity; Thermal force; Thermal stresses;
fLanguage
English
Journal_Title
Components, Packaging, and Manufacturing Technology, Part B: Advanced Packaging, IEEE Transactions on
Publisher
ieee
ISSN
1070-9894
Type
jour
DOI
10.1109/96.486509
Filename
486509
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