• DocumentCode
    768320
  • Title

    Temperature and stress time history responses in electronic packaging

  • Author

    Lau, John H.

  • Author_Institution
    Express Packaging Syst. Inc., Palo Alto, CA, USA
  • Volume
    19
  • Issue
    1
  • fYear
    1996
  • fDate
    2/1/1996 12:00:00 AM
  • Firstpage
    248
  • Lastpage
    254
  • Abstract
    The closed-form thermoelasticity solutions of electronic packages subjected to an instantaneous source of heat, and a heat source varying harmonically as function of time, are presented. Useful curves and charts which relate the variables, time, frequency, heat, temperature, stress, displacement, and material property are also provided for engineering practice convenience. Also, the present results can be used to verify finite element analysis procedures and interpret experimental data
  • Keywords
    deformation; finite element analysis; packaging; thermal analysis; thermal stresses; thermoelasticity; closed-form thermoelasticity solutions; displacement; electronic packaging; finite element analysis; frequency; heat; material property; stress time history response; temperature; time; Electronic packaging thermal management; Electronics packaging; Frequency; History; Poisson equations; Space heating; Temperature distribution; Thermal conductivity; Thermal force; Thermal stresses;
  • fLanguage
    English
  • Journal_Title
    Components, Packaging, and Manufacturing Technology, Part B: Advanced Packaging, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9894
  • Type

    jour

  • DOI
    10.1109/96.486509
  • Filename
    486509