DocumentCode :
768404
Title :
Dependence of the Magnetization on the Layer Thickness in Compositionally Modulated Fe/Y Thin Films
Author :
Morishita, T. ; Togami, Y. ; Tsushima, K.
Author_Institution :
NHK Science and Technical Research Laboratories.
Volume :
2
Issue :
2
fYear :
1987
Firstpage :
169
Lastpage :
170
Abstract :
Compositionally modulated thin films of Fe and Y--which normally form an amorphous alloy--were fabricated to investigate the variation in magnetism with the thickness of each layer. It was found that magnetization disappeared at dFe ¿2.4 Å, corresponding to a Fe0.4 Y0.6 composition alloy, agreeing with an Fe-Y amorphous alloy critical composition. When 6 Å ¿ dFe ¿ 12 Å, Mo was almost constant with respect to dFe. The central region of the Fe layer was composed of pure Fe but had reduced magnetization. This structure is peculiar to compositionally modulated films.
Keywords :
Amorphous magnetic materials; Amorphous materials; Chemicals; Iron alloys; Magnetic films; Magnetic modulators; Magnetization; Thickness measurement; Transistors; X-ray diffraction;
fLanguage :
English
Journal_Title :
Magnetics in Japan, IEEE Translation Journal on
Publisher :
ieee
ISSN :
0882-4959
Type :
jour
DOI :
10.1109/TJMJ.1987.4549364
Filename :
4549364
Link To Document :
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