Title :
Radiation induced defects in CVD-grown 3C-SiC
Author :
Itoh, Hisayoshi ; Yoshikawa, Masahito ; Nashiyama, Isamu ; Misawa, Shunji ; Okumura, Hajime ; Yoshida, Sadafumi
Author_Institution :
JAERI, Gunma, Japan
fDate :
12/1/1990 12:00:00 AM
Abstract :
Radiation-induced defects in 3C-SiC epitaxially grown by a chemical vapor deposition method were studied with the electron spin resonance (ESR) technique. A 15-line ESR spectrum was observed in 2-MeV proton and 1-MeV electron irradiated 3C-SiC when the magnetic field was applied parallel to the <100> axis. This spectrum, T1, which has an isotropic g-value of 2.0029±0.0001, was interpreted by simultaneous hyperfine interactions of a paramagnetic electron with the surrounding 13C at four carbon sites and 29Si at 12 silicon sites. The T1 spectrum appeared to arise from a point defect at a silicon site. The observed hyperfine interactions with neighboring 13C and 29Si nuclei are discussed in terms of a simple molecular-orbital treatment of the defect
Keywords :
crystal hyperfine field interactions; electron beam effects; paramagnetic resonance of defects; point defects; proton effects; semiconductor epitaxial layers; semiconductor materials; silicon compounds; 1 MeV; 2 MeV; 3C phase; ESR spectrum; T1 spectrum; chemical vapor deposition; electron irradiation; epitaxial films; hyperfine interactions; isotropic g-value; molecular-orbital treatment; paramagnetic electron; point defect; proton irradiation; radiation induced defects; Annealing; Chemical vapor deposition; Electron mobility; Magnetic fields; Neutrons; Nuclear electronics; Paramagnetic resonance; Performance evaluation; Protons; Silicon carbide;
Journal_Title :
Nuclear Science, IEEE Transactions on