• DocumentCode
    768556
  • Title

    Guest Editor´s Introduction: ITC Helps Get More Out of Test

  • Author

    Butler, Kenneth M.

  • Author_Institution
    Texas Instruments
  • Volume
    23
  • Issue
    5
  • fYear
    2006
  • fDate
    5/1/2006 12:00:00 AM
  • Firstpage
    388
  • Lastpage
    389
  • Abstract
    This special section, along with the International Test Conference 2006, highlights the value that test adds to the electronics manufacturing business. It leads us to think about test in a whole new way.
  • Keywords
    International Test Conference; test; Clocks; Companies; Delay; Electronic equipment testing; Instruments; Integrated circuit modeling; Integrated circuit testing; Peer to peer computing; Semiconductor device modeling; Virtual manufacturing; International Test Conference; test;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2006.120
  • Filename
    1704730
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=768556